{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T07:12:48Z","timestamp":1772349168948,"version":"3.50.1"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,12]],"date-time":"2022-06-12T00:00:00Z","timestamp":1654992000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,12]],"date-time":"2022-06-12T00:00:00Z","timestamp":1654992000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,12]]},"DOI":"10.1109\/vlsitechnologyandcir46769.2022.9830440","type":"proceedings-article","created":{"date-parts":[[2022,7,22]],"date-time":"2022-07-22T16:42:52Z","timestamp":1658508172000},"page":"421-422","source":"Crossref","is-referenced-by-count":8,"title":["On the PBTI Reliability of Low EOT Negative Capacitance 1.8 nm HfO<sub>2<\/sub>-ZrO<sub>2<\/sub> Superlattice Gate Stack on L<sub>g<\/sub>=90 nm nFETs"],"prefix":"10.1109","author":[{"given":"Nirmaan","family":"Shanker","sequence":"first","affiliation":[{"name":"University of California,Berkeley,CA,USA"}]},{"given":"Li-Chen","family":"Wang","sequence":"additional","affiliation":[{"name":"University of California,Berkeley,CA,USA"}]},{"given":"Suraj","family":"Cheema","sequence":"additional","affiliation":[{"name":"University of California,Berkeley,CA,USA"}]},{"given":"Wenshen","family":"Li","sequence":"additional","affiliation":[{"name":"University of California,Berkeley,CA,USA"}]},{"given":"Nilotpal","family":"Choudhury","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Bombay,Mumbai,India"}]},{"given":"Chenming","family":"Hu","sequence":"additional","affiliation":[{"name":"University of California,Berkeley,CA,USA"}]},{"given":"Souvik","family":"Mahapatra","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Bombay,Mumbai,India"}]},{"given":"Sayeef","family":"Salahuddin","sequence":"additional","affiliation":[{"name":"University of California,Berkeley,CA,USA"}]}],"member":"263","reference":[{"key":"ref4","author":"cartier","year":"2011","journal-title":"IEDM"},{"key":"ref3","author":"joshi","year":"2013","journal-title":"IRPS"},{"key":"ref6","author":"li","year":"2021","journal-title":"IEDM"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1021\/nl071804g","volume":"8","author":"salahuddin","year":"2008","journal-title":"Nano Letters"},{"key":"ref8","first-page":"1281","volume":"8","author":"choudhury","year":"2020","journal-title":"IEEE JED"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2780083"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/ma5030478"},{"key":"ref9","author":"mukhopadhyay","year":"2014","journal-title":"IRPS"},{"key":"ref1","author":"cheema","year":"2022","journal-title":"Nature"}],"event":{"name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Honolulu, HI, USA","start":{"date-parts":[[2022,6,12]]},"end":{"date-parts":[[2022,6,17]]}},"container-title":["2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9830116\/9830138\/09830440.pdf?arnumber=9830440","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,15]],"date-time":"2022-08-15T20:03:48Z","timestamp":1660593828000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9830440\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vlsitechnologyandcir46769.2022.9830440","relation":{},"subject":[],"published":{"date-parts":[[2022,6,12]]}}}