{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T09:19:58Z","timestamp":1778923198245,"version":"3.51.4"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,12]],"date-time":"2022-06-12T00:00:00Z","timestamp":1654992000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,12]],"date-time":"2022-06-12T00:00:00Z","timestamp":1654992000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100018058","name":"SK Hynix","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100018058","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,12]]},"DOI":"10.1109\/vlsitechnologyandcir46769.2022.9830445","type":"proceedings-article","created":{"date-parts":[[2022,7,22]],"date-time":"2022-07-22T16:42:52Z","timestamp":1658508172000},"page":"304-305","source":"Crossref","is-referenced-by-count":15,"title":["First Demonstration of 1-bit Erase in Vertical NAND Flash Memory"],"prefix":"10.1109","author":[{"given":"Ho-Nam","family":"Yoo","sequence":"first","affiliation":[{"name":"Seoul National University,School of ECE and ISRC,Seoul,Korea,08826"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jong-Won","family":"Back","sequence":"additional","affiliation":[{"name":"Seoul National University,School of ECE and ISRC,Seoul,Korea,08826"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nam-Hun","family":"Kim","sequence":"additional","affiliation":[{"name":"Seoul National University,School of ECE and ISRC,Seoul,Korea,08826"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongseok","family":"Kwon","sequence":"additional","affiliation":[{"name":"Seoul National University,School of ECE and ISRC,Seoul,Korea,08826"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Byung-Gook","family":"Park","sequence":"additional","affiliation":[{"name":"Seoul National University,School of ECE and ISRC,Seoul,Korea,08826"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jong-Ho","family":"Lee","sequence":"additional","affiliation":[{"name":"Seoul National University,School of ECE and ISRC,Seoul,Korea,08826"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","author":"park","year":"2015","journal-title":"IMW"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/aae975"},{"key":"ref5","first-page":"1","author":"komori","year":"2008","journal-title":"IEDM"},{"key":"ref2","author":"fukuchi","year":"2021","journal-title":"ISCAS"},{"key":"ref1","first-page":"220","author":"huh","year":"2020","journal-title":"ISSCC"}],"event":{"name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Honolulu, HI, USA","start":{"date-parts":[[2022,6,12]]},"end":{"date-parts":[[2022,6,17]]}},"container-title":["2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9830116\/9830138\/09830445.pdf?arnumber=9830445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T22:59:40Z","timestamp":1667516380000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9830445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,12]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/vlsitechnologyandcir46769.2022.9830445","relation":{},"subject":[],"published":{"date-parts":[[2022,6,12]]}}}