{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T02:11:37Z","timestamp":1767924697487,"version":"3.49.0"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,16]],"date-time":"2024-06-16T00:00:00Z","timestamp":1718496000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,16]],"date-time":"2024-06-16T00:00:00Z","timestamp":1718496000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,16]]},"DOI":"10.1109\/vlsitechnologyandcir46783.2024.10631351","type":"proceedings-article","created":{"date-parts":[[2024,8,26]],"date-time":"2024-08-26T17:23:31Z","timestamp":1724693011000},"page":"1-2","source":"Crossref","is-referenced-by-count":8,"title":["First Demonstration of Fully Integrated 16 nm Half-Pitch Selector Only Memory (SOM) for Emerging CXL Memory"],"prefix":"10.1109","author":[{"given":"Myoungsub","family":"Kim","sequence":"first","affiliation":[{"name":"R&D"}]},{"given":"Yooncheol","family":"Bae","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Jaehyuk","family":"Park","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Jeongho","family":"Yeon","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Hyungjoon","family":"Shim","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Sehyun","family":"Jin","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Hyunsoo","family":"Kim","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Sangchul","family":"Oh","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Gapsok","family":"Do","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Dongyeol","family":"Yun","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Hyung Dong","family":"Lee","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"David","family":"Ahn","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Junghun","family":"Lee","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Muhui","family":"Park","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Junghyuk","family":"Yoon","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Jeongho","family":"Yi","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Taekseung","family":"Kim","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Gain","family":"Park","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Seoungju","family":"Chung","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Junho","family":"Cheon","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Sujin","family":"Chae","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Namkyun","family":"Park","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Kyunghoon","family":"Kim","sequence":"additional","affiliation":[{"name":"DRAM Development, SK hynix Inc.,Icheon,Republic of Korea"}]},{"given":"Dongyean","family":"Oh","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Jaeyun","family":"Yi","sequence":"additional","affiliation":[{"name":"R&D"}]},{"given":"Seonyong","family":"Cha","sequence":"additional","affiliation":[{"name":"R&D"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.5772\/139"},{"key":"ref2","first-page":"18.6.1","author":"Hong","year":"2022","journal-title":"IEDM"},{"key":"ref3","author":"Ielmini","year":"2007","journal-title":"J. Appl. Phys"},{"key":"ref4","author":"Park","year":"2023","journal-title":"IEDM"}],"event":{"name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Honolulu, HI, USA","start":{"date-parts":[[2024,6,16]]},"end":{"date-parts":[[2024,6,20]]}},"container-title":["2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10631290\/10631310\/10631351.pdf?arnumber=10631351","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,31]],"date-time":"2024-08-31T04:49:25Z","timestamp":1725079765000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10631351\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,16]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/vlsitechnologyandcir46783.2024.10631351","relation":{},"subject":[],"published":{"date-parts":[[2024,6,16]]}}}