{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T21:41:35Z","timestamp":1769204495111,"version":"3.49.0"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,16]],"date-time":"2024-06-16T00:00:00Z","timestamp":1718496000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,16]],"date-time":"2024-06-16T00:00:00Z","timestamp":1718496000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,16]]},"DOI":"10.1109\/vlsitechnologyandcir46783.2024.10631519","type":"proceedings-article","created":{"date-parts":[[2024,8,26]],"date-time":"2024-08-26T17:23:31Z","timestamp":1724693011000},"page":"1-2","source":"Crossref","is-referenced-by-count":4,"title":["A 7.2inch 5.5Mpixel 600mW SPAD X-Ray Detector with 116.7 dB Dynamic Range"],"prefix":"10.1109","author":[{"given":"Byungchoul","family":"Park","sequence":"first","affiliation":[{"name":"Yonsei University,Seoul,Korea"}]},{"given":"Hyun-Seung","family":"Choi","sequence":"additional","affiliation":[{"name":"KIST,Seoul,Korea"}]},{"given":"Jinwoong","family":"Jeong","sequence":"additional","affiliation":[{"name":"Rayence,Hwaseong,Korea"}]},{"given":"Jimin","family":"Cheon","sequence":"additional","affiliation":[{"name":"Kumho National Institute of Tech.,Gumi,Korea"}]},{"given":"Myung-Jae","family":"Lee","sequence":"additional","affiliation":[{"name":"KIST,Seoul,Korea"}]},{"given":"Youngcheol","family":"Chae","sequence":"additional","affiliation":[{"name":"Yonsei University,Seoul,Korea"}]}],"member":"263","reference":[{"key":"ref1","first-page":"434","volume-title":"IEEE ISSCC","author":"Lee","year":"2020"},{"key":"ref2","first-page":"1","volume-title":"IISW","author":"Derks","year":"2019"},{"key":"ref3","first-page":"339","volume-title":"IEEE IEDM","author":"Shike","year":"2020"},{"key":"ref4","first-page":"100","volume-title":"IEEE ISSCC","author":"Park","year":"2023"}],"event":{"name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Honolulu, HI, USA","start":{"date-parts":[[2024,6,16]]},"end":{"date-parts":[[2024,6,20]]}},"container-title":["2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10631290\/10631310\/10631519.pdf?arnumber=10631519","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T04:44:09Z","timestamp":1725252249000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10631519\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,16]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/vlsitechnologyandcir46783.2024.10631519","relation":{},"subject":[],"published":{"date-parts":[[2024,6,16]]}}}