{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,10]],"date-time":"2025-05-10T06:49:07Z","timestamp":1746859747557},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,10]],"date-time":"2023-10-10T00:00:00Z","timestamp":1696896000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,10]],"date-time":"2023-10-10T00:00:00Z","timestamp":1696896000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,10]]},"DOI":"10.1109\/vtc2023-fall60731.2023.10333489","type":"proceedings-article","created":{"date-parts":[[2023,12,11]],"date-time":"2023-12-11T14:37:48Z","timestamp":1702305468000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["How Long Can RIS Work Effectively: An Electronic Reliability Perspective"],"prefix":"10.1109","author":[{"given":"Ke","family":"Wang","sequence":"first","affiliation":[{"name":"Macao Polytechnic University,Faculty of Applied Sciences,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chan-Tong","family":"Lam","sequence":"additional","affiliation":[{"name":"Macao Polytechnic University,Faculty of Applied Sciences,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin K.","family":"Ng","sequence":"additional","affiliation":[{"name":"Macao Polytechnic University,Faculty of Applied Sciences,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2021.3051897"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2923997"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2020.3007211"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2021.3130549"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2977772"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2020.3024887"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2021.3116151"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3223447"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/gcwkshps52748.2021.9681939"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2020.2990431"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2020.3001125"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/9781119961260"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/b97414"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/ell2.12714"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SPAWC51858.2021.9593104"}],"event":{"name":"2023 IEEE 98th Vehicular Technology Conference (VTC2023-Fall)","start":{"date-parts":[[2023,10,10]]},"location":"Hong Kong, Hong Kong","end":{"date-parts":[[2023,10,13]]}},"container-title":["2023 IEEE 98th Vehicular Technology Conference (VTC2023-Fall)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10333258\/10333344\/10333489.pdf?arnumber=10333489","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T17:28:57Z","timestamp":1703006937000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10333489\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,10]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/vtc2023-fall60731.2023.10333489","relation":{},"subject":[],"published":{"date-parts":[[2023,10,10]]}}}