{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,11]],"date-time":"2025-04-11T05:10:44Z","timestamp":1744348244094},"reference-count":17,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2003.1197675","type":"proceedings-article","created":{"date-parts":[[2003,10,31]],"date-time":"2003-10-31T09:39:17Z","timestamp":1067593157000},"page":"359-364","source":"Crossref","is-referenced-by-count":43,"title":["BIST-aided scan test - a new method for test cost reduction"],"prefix":"10.1109","author":[{"given":"T.","family":"Hiraide","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kwame Osei Boateng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Konishi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Itaya","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Emori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Yamanaka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Mochiyama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041775"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011118"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041756"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223600"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/12.54855"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1147\/rd.332.0149"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.479997"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597194"},{"article-title":"Built-In Test for VLSI","year":"1987","author":"bardell","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.273.0265"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"}],"event":{"name":"21st VLSI Test Symposium (VTS 03)","acronym":"VTEST-03","location":"Napa, CA, USA"},"container-title":["Proceedings. 21st VLSI Test Symposium, 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8533\/26948\/01197675.pdf?arnumber=1197675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T12:57:48Z","timestamp":1489409868000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1197675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/vtest.2003.1197675","relation":{},"subject":[]}}