{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:30:52Z","timestamp":1725535852004},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2004.1299219","type":"proceedings-article","created":{"date-parts":[[2004,6,10]],"date-time":"2004-06-10T10:19:45Z","timestamp":1086862785000},"page":"9-15","source":"Crossref","is-referenced-by-count":6,"title":["Excitation, observation, and ELF-MD: optimization criteria for high quality test sets"],"prefix":"10.1109","author":[{"given":"J.","family":"Dworak","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Dorsey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.R.","family":"Mercer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527817"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271073"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207864"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998255"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766675"},{"key":"4","first-page":"91","article-title":"Quantifying non-target defect detection by target fault test sets","author":"butler","year":"1991","journal-title":"Proc European Test Conference"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915070"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173514"}],"event":{"name":"22nd IEEE VLSI Test Symposium, 2004.","location":"Napa Valley, CA, USA"},"container-title":["22nd IEEE VLSI Test Symposium, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9095\/28867\/01299219.pdf?arnumber=1299219","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T17:08:40Z","timestamp":1489424920000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1299219\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/vtest.2004.1299219","relation":{},"subject":[]}}