{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T11:15:07Z","timestamp":1772104507044,"version":"3.50.1"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2004.1299225","type":"proceedings-article","created":{"date-parts":[[2004,6,10]],"date-time":"2004-06-10T14:19:45Z","timestamp":1086877185000},"page":"53-58","source":"Crossref","is-referenced-by-count":3,"title":["Built-in current sensor for \u0394I\/sub DDQ\/ testing of deep submicron digital CMOS ICs"],"prefix":"10.1109","author":[{"given":"J.R.","family":"Vazquez","sequence":"first","affiliation":[]},{"given":"J.","family":"Pineda de Gyvez","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"738","article-title":"Current Ratios: A Self-Scaling Technique for Production IDDQ Testing","author":"maxwell","year":"1999","journal-title":"Proceedings of International Test Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.599445"},{"key":"ref12","first-page":"207","article-title":"Improving Delta-IDDQ-Based Test Methods","author":"thibeault","year":"2000","journal-title":"Proceedings of International Test Conference"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2002.1016891"},{"key":"ref14","first-page":"724","article-title":"IDDQ Testing in deep sub-micron integrated circuits","author":"miller","year":"1999","journal-title":"Proceedings of International Test Conference"},{"key":"ref15","article-title":"Semiconductor Industries Association, International Technology Roadmap for Semiconductors","year":"1999"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1109\/TEST.2001.966657","article-title":"A Practical Current Sensor for IDDQ Testing","author":"kim","year":"2001","journal-title":"Proc Int Test Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20010337"},{"key":"ref18","first-page":"9","article-title":"A New Scheme for Effective IDDQ Testing in Deep Submicron","author":"tsiatohuas","year":"2000","journal-title":"Proceedings of International Conference on Defect Based Testing"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/54.735928"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470341"},{"key":"ref6","first-page":"1051","article-title":"Multiple-Parameter CMOS IC Testing with Increased Sensitivity for IDDQ","author":"keshavarzi","year":"2000","journal-title":"Proceedings of International Test Conference"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639607"},{"key":"ref8","first-page":"730","article-title":"Clustering Based Techniques for IDDQ Testing","author":"jandhyala","year":"1999","journal-title":"Proceedings of International Test Conference"},{"key":"ref7","first-page":"10l","article-title":"The Future of Delta-IDDQ Testing","author":"kruseman","year":"2001","journal-title":"Proceedings of International Test Conference"},{"key":"ref2","first-page":"316","article-title":"A New Approach to Dynamic IDD Testing","author":"keating","year":"1987","journal-title":"Proceedings of International Test Conference"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2001.929773"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1109\/TEST.2001.966622","article-title":"Neighbour Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"Proceedings of International Test Conference"}],"event":{"name":"22nd IEEE VLSI Test Symposium, 2004.","location":"Napa Valley, CA, USA"},"container-title":["22nd IEEE VLSI Test Symposium, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9095\/28867\/01299225.pdf?arnumber=1299225","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T07:57:24Z","timestamp":1497599844000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1299225\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vtest.2004.1299225","relation":{},"subject":[]}}