{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T12:02:29Z","timestamp":1759147349116},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2004.1299228","type":"proceedings-article","created":{"date-parts":[[2004,6,10]],"date-time":"2004-06-10T10:19:45Z","timestamp":1086862785000},"page":"73-78","source":"Crossref","is-referenced-by-count":51,"title":["Changing the scan enable during shift"],"prefix":"10.1109","author":[{"given":"N.","family":"Sitchinava","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Samaranayake","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Kapur","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Gizdarski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Neuveux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.W.","family":"Williams","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041754"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197627"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011104"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843829"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743186"},{"key":"9","first-page":"9","article-title":"A reconfigurable shared scan-in architecture","author":"samaranayake","year":"2003","journal-title":"Proceedings of the VLSI Test Symposium"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2002.1039519"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/2.803644"}],"event":{"name":"22nd IEEE VLSI Test Symposium, 2004.","location":"Napa Valley, CA, USA"},"container-title":["22nd IEEE VLSI Test Symposium, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9095\/28867\/01299228.pdf?arnumber=1299228","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T14:36:26Z","timestamp":1489415786000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1299228\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vtest.2004.1299228","relation":{},"subject":[]}}