{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T12:29:50Z","timestamp":1742387390072},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2004.1299243","type":"proceedings-article","created":{"date-parts":[[2004,6,10]],"date-time":"2004-06-10T14:19:45Z","timestamp":1086877185000},"page":"193-198","source":"Crossref","is-referenced-by-count":2,"title":["Planar high performance ring generators"],"prefix":"10.1109","author":[{"given":"G.","family":"Mrugalski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Mukherjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675590"},{"journal-title":"Generation and Application of Pseudorandom Sequences for Random Testing","year":"1988","author":"yarmolik","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/43.875312"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.3134"},{"key":"11","first-page":"57","article-title":"High speed ring generators and compactors of test data","author":"mrugalski","year":"2003","journal-title":"Proc VTS"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"journal-title":"Built-In Test for VLSI Pseudorandom Techniques","year":"1987","author":"bardell","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1007\/BF00134016"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675298"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1971.223220"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041856"},{"journal-title":"Shift Register Sequences","year":"1982","author":"golomb","key":"6"},{"key":"5","first-page":"184","article-title":"On some theoretical properties of LFSRs for BIST applications","author":"dufaza","year":"1997","journal-title":"Proc Int On-Line Testing Workshop"},{"journal-title":"Additive Cellular Automata","year":"1997","author":"chaudhuri","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197676"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.223877"}],"event":{"name":"22nd IEEE VLSI Test Symposium, 2004.","location":"Napa Valley, CA, USA"},"container-title":["22nd IEEE VLSI Test Symposium, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9095\/28867\/01299243.pdf?arnumber=1299243","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:15:13Z","timestamp":1489439713000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1299243\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/vtest.2004.1299243","relation":{},"subject":[]}}