{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T16:03:52Z","timestamp":1730304232809,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2004.1299252","type":"proceedings-article","created":{"date-parts":[[2004,6,10]],"date-time":"2004-06-10T10:19:45Z","timestamp":1086862785000},"page":"261-266","source":"Crossref","is-referenced-by-count":7,"title":["An on-chip transfer function characterization system for analog built-in testing"],"prefix":"10.1109","author":[{"given":"A.","family":"Valdes-Garcia","sequence":"first","affiliation":[]},{"given":"J.","family":"Silva-Martinez","sequence":"additional","affiliation":[]},{"given":"E.","family":"Sanchez-Sinencio","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"643","article-title":"Application of group delay equalization in testing fully-balanced Ota-c Filters","volume":"4","author":"wilcock","year":"2002","journal-title":"IEEE ISCAS"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292337"},{"journal-title":"RF\/IF Gain and Phase Detector AD8302 by Analog Devices","year":"0","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/82.728852"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.1999.769820"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528008"},{"key":"5","first-page":"401","article-title":"A current-mode testable design of operational transconductance amplifier-capacitor filters","volume":"46","author":"lee","year":"1999","journal-title":"IEEE TCAS-II"},{"key":"4","first-page":"929","article-title":"Testable design of multiple-stage OTA-C filters","volume":"49","author":"hsu","year":"2000","journal-title":"IEEE TIM"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.809520"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/31.45712"},{"year":"0","key":"11"}],"event":{"name":"22nd IEEE VLSI Test Symposium, 2004.","location":"Napa Valley, CA, USA"},"container-title":["22nd IEEE VLSI Test Symposium, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9095\/28867\/01299252.pdf?arnumber=1299252","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:18:35Z","timestamp":1489439915000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1299252\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vtest.2004.1299252","relation":{},"subject":[]}}