{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:55:22Z","timestamp":1759146922358,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.2004.1299267","type":"proceedings-article","created":{"date-parts":[[2004,6,10]],"date-time":"2004-06-10T10:19:45Z","timestamp":1086862785000},"page":"377-382","source":"Crossref","is-referenced-by-count":25,"title":["Prediction of analog performance parameters using oscillation based test"],"prefix":"10.1109","author":[{"given":"A.","family":"Raghunathan","sequence":"first","affiliation":[]},{"family":"Hong Joong Shin","sequence":"additional","affiliation":[]},{"given":"J.A.","family":"Abraham","sequence":"additional","affiliation":[]},{"given":"A.","family":"Chatterjee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/MDT.2002.1047746"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/43.644035"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/19.779176"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/43.986428"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/VTEST.1998.670860"},{"key":"5","doi-asserted-by":"crossref","first-page":"1409","DOI":"10.1109\/TCAD.2003.818133","article-title":"A comprehensive signature analysis scheme for oscillation-test","volume":"22","author":"roh","year":"2003","journal-title":"IEEE Trans on Computer-Aided Design of Integrated Circuits and Systems"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TEST.1997.639692"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1214\/aos\/1176347963"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/VTEST.2000.843837"}],"event":{"name":"22nd IEEE VLSI Test Symposium, 2004.","location":"Napa Valley, CA, USA"},"container-title":["22nd IEEE VLSI Test Symposium, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9095\/28867\/01299267.pdf?arnumber=1299267","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T03:57:24Z","timestamp":1497585444000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1299267\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vtest.2004.1299267","relation":{},"subject":[]}}