{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,26]],"date-time":"2025-09-26T13:05:10Z","timestamp":1758891910092},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vts.2002.1011117","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T16:42:54Z","timestamp":1056559374000},"page":"91-96","source":"Crossref","is-referenced-by-count":15,"title":["How effective are compression codes for reducing test data volume?"],"prefix":"10.1109","author":[{"given":"A.","family":"Chandra","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.A.","family":"Medina","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.913754"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743186"},{"key":"ref10","first-page":"2.3?1","article-title":"I\/O Bandwidth Bottleneck for Test: Is it Real?","author":"khoche","year":"2000","journal-title":"Proc Test Resource Partitioning Workshop"},{"key":"ref6","first-page":"42","article-title":"Frequency-directed runlength (FDR) codes with application to system-on-a-chip test data compression","author":"chandra","year":"2001","journal-title":"Proc IEEE VLSI Test Symposium"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144279"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1147\/rd.182.0164"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1966.1053907"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.953275"},{"journal-title":"Data Compression Methods and Theory","year":"1988","author":"storer","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/6.774966"}],"event":{"name":"20th IEEE VLSI Test Symposium (VTS 2002)","acronym":"VTEST-02","location":"Monterey, CA, USA"},"container-title":["Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7901\/21789\/01011117.pdf?arnumber=1011117","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T11:54:40Z","timestamp":1489146880000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1011117\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vts.2002.1011117","relation":{},"subject":[]}}