{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:28Z","timestamp":1749205528521},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vts.2002.1011119","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T20:42:54Z","timestamp":1056573774000},"page":"103-108","source":"Crossref","is-referenced-by-count":65,"title":["On test data volume reduction for multiple scan chain designs"],"prefix":"10.1109","author":[{"given":"S.M.","family":"Reddy","sequence":"first","affiliation":[]},{"given":"K.","family":"Miyase","sequence":"additional","affiliation":[]},{"given":"S.","family":"Kajihara","sequence":"additional","affiliation":[]},{"given":"I.","family":"Pomeranz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"237","article-title":"LFSR-Coded Test Patterns for Scan Designs","author":"koneman","year":"1993","journal-title":"Proc European Test Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144279"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843829"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766654"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968648"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378388"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923416"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.238040"}],"event":{"name":"20th IEEE VLSI Test Symposium (VTS 2002)","acronym":"VTEST-02","location":"Monterey, CA, USA"},"container-title":["Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7901\/21789\/01011119.pdf?arnumber=1011119","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T17:06:21Z","timestamp":1489165581000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1011119\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vts.2002.1011119","relation":{},"subject":[]}}