{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T21:57:02Z","timestamp":1725746222810},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2002]]},"DOI":"10.1109\/vts.2002.1011123","type":"proceedings-article","created":{"date-parts":[[2005,8,25]],"date-time":"2005-08-25T03:23:34Z","timestamp":1124940214000},"page":"129-129","source":"Crossref","is-referenced-by-count":0,"title":["A successful DFT tester: what will it look like? Is DFT tester a logical next step in ATE evolution?"],"prefix":"10.1109","author":[{"family":"Lee Song","sequence":"first","affiliation":[{"name":"Teradyne"}]},{"given":"P.","family":"Patton","sequence":"additional","affiliation":[]},{"given":"W.","family":"Radermacher","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","start":{"date-parts":[[2002,4,28]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2002,5,2]]}},"container-title":["Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7901\/21789\/01011123.pdf?arnumber=1011123","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,8]],"date-time":"2024-04-08T20:45:41Z","timestamp":1712609141000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1011123\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2002.1011123","relation":{},"subject":[],"published":{"date-parts":[[2002]]}}}