{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T11:31:09Z","timestamp":1742383869752,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2002,1,1]],"date-time":"2002-01-01T00:00:00Z","timestamp":1009843200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2002]]},"DOI":"10.1109\/vts.2002.1011143","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T20:42:54Z","timestamp":1056573774000},"page":"229-236","source":"Crossref","is-referenced-by-count":19,"title":["An industrial environment for high-level fault-tolerant structures insertion and validation"],"prefix":"10.1109","author":[{"given":"L.","family":"Berrojo","sequence":"first","affiliation":[{"name":"Alcatel Espacio S.A., Madrid, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Corno","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Entrena","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Gonzalez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Lopez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Sonza Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Squillero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856613"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/54.544533"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937817"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.903784"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998398"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref1","article-title":"Fault Tolerant VHDL architectures for Space Applications","author":"alcala","year":"1997","journal-title":"Proceedings VHDL International User's Forum"}],"event":{"name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","start":{"date-parts":[[2002,4,28]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2002,5,2]]}},"container-title":["Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7901\/21789\/01011143.pdf?arnumber=1011143","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:46:14Z","timestamp":1729705574000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1011143\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/vts.2002.1011143","relation":{},"subject":[],"published":{"date-parts":[[2002]]}}}