{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T15:48:24Z","timestamp":1743436104655},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vts.2002.1011176","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T16:42:54Z","timestamp":1056559374000},"page":"433-438","source":"Crossref","is-referenced-by-count":2,"title":["Practical solutions for the application of the oscillation-based-test: start-up and on-chip evaluation"],"prefix":"10.1109","author":[{"given":"D.","family":"Vazquez","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Huertas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Leger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Rueda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.L.","family":"Huertas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ICCD.1998.727021"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/19.779176"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/JSSC.1985.1052358"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TEST.1999.805779"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/VTEST.1996.510833"},{"key":"ref5","first-page":"249","article-title":"Oscillation-based Test Experiments in Filters: A DTMF Example","author":"huertas","year":"1999","journal-title":"Proc Intl Mixed-Signal Test Workshop"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/VTEST.2000.843838"},{"key":"ref7","article-title":"Practical Methods for Reading Test Outcomes in Oscillation-Based Test","author":"huertas","year":"2000","journal-title":"Proc Intl Mixed-Signal Test Workshop"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/43.644035"},{"year":"1997","author":"norsworthy","article-title":"Delta-sigma data converters","key":"ref9"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/VTEST.1996.510896"}],"event":{"acronym":"VTEST-02","name":"20th IEEE VLSI Test Symposium (VTS 2002)","location":"Monterey, CA, USA"},"container-title":["Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7901\/21789\/01011176.pdf?arnumber=1011176","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T11:46:33Z","timestamp":1489146393000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1011176\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vts.2002.1011176","relation":{},"subject":[]}}