{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:13:04Z","timestamp":1763467984161},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/vts.2010.5469586","type":"proceedings-article","created":{"date-parts":[[2010,5,28]],"date-time":"2010-05-28T13:00:33Z","timestamp":1275051633000},"page":"165-170","source":"Crossref","is-referenced-by-count":10,"title":["Scalable and accurate estimation of probabilistic behavior in sequential circuits"],"prefix":"10.1109","author":[{"given":"Chien-Chih","family":"Yu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John P.","family":"Hayes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1297666.1297674"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.100"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.917591"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.46"},{"journal-title":"Artificial Intelligence-A Modern Approach","year":"2001","author":"russell","key":"ref14"},{"key":"ref15","first-page":"220","article-title":"PREDICT-probabilistic estimation of digital circuit reliability","author":"seth","year":"1985","journal-title":"Proc FTCS"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.479880"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2008.4695897"},{"key":"ref18","first-page":"27","article-title":"FASER: fast analysis of soft error susceptibility for cell-based designs","author":"zhang","year":"2006","journal-title":"Proc ISQED"},{"key":"ref4","first-page":"497","article-title":"Soft error derating computation in sequential circuits","author":"asadi","year":"2006","journal-title":"Proc ICCAD"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.61"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.43"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159727"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.146"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313324"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465256"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1984.5005582"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.47"}],"event":{"name":"2010 28th VLSI Test Symposium (VTS)","start":{"date-parts":[[2010,4,19]]},"location":"Santa Cruz, CA, USA","end":{"date-parts":[[2010,4,22]]}},"container-title":["2010 28th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5464131\/5469528\/05469586.pdf?arnumber=5469586","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T05:26:09Z","timestamp":1489901169000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5469586\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2010.5469586","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}