{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,30]],"date-time":"2025-01-30T19:40:20Z","timestamp":1738266020619,"version":"3.35.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2010,4,1]],"date-time":"2010-04-01T00:00:00Z","timestamp":1270080000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2010,4,1]],"date-time":"2010-04-01T00:00:00Z","timestamp":1270080000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/vts.2010.5469590","type":"proceedings-article","created":{"date-parts":[[2010,5,28]],"date-time":"2010-05-28T13:00:33Z","timestamp":1275051633000},"page":"141-146","source":"Crossref","is-referenced-by-count":14,"title":["Low-capture-power at-speed testing using partial launch-on-capture test scheme"],"prefix":"10.1109","author":[{"given":"Zhen","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Computer Science and Technology"}]},{"given":"Dong","family":"Xiang","sequence":"additional","affiliation":[{"name":"School of Software Tsinghua National Laboratory for Information Science and Technology, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Preferred fill: a scalable method to reduce capture power for scan based designs","author":"remersaro","year":"2006","journal-title":"Proc of ITC"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.829797"},{"key":"ref12","first-page":"319","article-title":"Reducing power dissipation during test using scan chain disable","year":"2001","journal-title":"Proc of VTS"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/92.311647"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref15","first-page":"299","article-title":"A novel scan architecture for power efficient, rapid test","author":"sinanoglu","year":"2002","journal-title":"Proc of ICCAD"},{"key":"ref16","first-page":"1019","article-title":"Low-capture-power test generation for scan-based at-speed testing","author":"wen","year":"2005","journal-title":"Proc ITC"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.18"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.893657"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.807890"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2006091"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1535","DOI":"10.1109\/TCAD.2005.857379","article-title":"Pseudofunctional testing","volume":"25","author":"lin","year":"2006","journal-title":"IEEE Trans on Computer-Aided Design"},{"key":"ref8","article-title":"Multilevel Hypergraph Partitioning: Applications in VLSI Domain","author":"karypis","year":"1998","journal-title":"Technical Report 1998"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.82"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.998630"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386971"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"}],"event":{"name":"2010 28th VLSI Test Symposium (VTS)","start":{"date-parts":[[2010,4,19]]},"location":"Santa Cruz, CA, USA","end":{"date-parts":[[2010,4,22]]}},"container-title":["2010 28th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5464131\/5469528\/05469590.pdf?arnumber=5469590","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,30]],"date-time":"2025-01-30T19:10:28Z","timestamp":1738264228000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5469590\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2010.5469590","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}