{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:42:05Z","timestamp":1725615725248},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/vts.2011.5783726","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T16:35:25Z","timestamp":1307464525000},"page":"229-234","source":"Crossref","is-referenced-by-count":1,"title":["Localization of damaged resources in NoC based shared-memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure"],"prefix":"10.1109","author":[{"given":"Zhen","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitri","family":"Refauvelet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alain","family":"Greiner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mounir","family":"Benabdenbi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francois","family":"Pecheux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2008.4492733"},{"key":"ref11","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4020-2801-4","author":"gizopoulos","year":"2004","journal-title":"Embedded Processor-Based Self-Test"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1119772.1119817"},{"journal-title":"SoCLib","year":"0","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2010.5560209"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391584"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.41"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.45"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195986"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.41"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.28"},{"year":"0","key":"ref1","article-title":"International Technology Roadmap for Semiconductors"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/NANONET.2006.346219"}],"event":{"name":"2011 IEEE VLSI Test Symposium (VTS)","start":{"date-parts":[[2011,5,1]]},"location":"Dana Point, CA, USA","end":{"date-parts":[[2011,5,5]]}},"container-title":["29th VLSI Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5772241\/5783722\/05783726.pdf?arnumber=5783726","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T21:16:10Z","timestamp":1497906970000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783726\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/vts.2011.5783726","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}