{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,8]],"date-time":"2026-02-08T04:52:23Z","timestamp":1770526343445,"version":"3.49.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/vts.2011.5783738","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T20:35:25Z","timestamp":1307478925000},"page":"303-308","source":"Crossref","is-referenced-by-count":9,"title":["Multi Domain Test: Novel test strategy to reduce the Cost of Test"],"prefix":"10.1109","author":[{"given":"Yasuhiro","family":"Takahashi","sequence":"first","affiliation":[]},{"given":"Akinori","family":"Maeda","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.101"},{"key":"ref3","article-title":"Implementation of a Concurrent Test Plan for a System in Package Device","author":"myers","year":"2007","journal-title":"Verigy VOICE 2007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966736"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041875"},{"key":"ref2","article-title":"Concurrent Test Implementation on a 2G\/3G Baseband Device","author":"perez","year":"2008","journal-title":"Verigy VOICE 2008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387340"}],"event":{"name":"2011 IEEE VLSI Test Symposium (VTS)","location":"Dana Point, CA, USA","start":{"date-parts":[[2011,5,1]]},"end":{"date-parts":[[2011,5,5]]}},"container-title":["29th VLSI Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5772241\/5783722\/05783738.pdf?arnumber=5783738","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T07:00:28Z","timestamp":1490079628000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783738\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/vts.2011.5783738","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}