{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:54:35Z","timestamp":1730303675431,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/vts.2011.5783743","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T16:35:25Z","timestamp":1307464525000},"page":"324-327","source":"Crossref","is-referenced-by-count":3,"title":["Invited paper: Yin and Yang of embedded sensors for post-scaling-era"],"prefix":"10.1109","author":[{"given":"Anne","family":"Gattiker","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"A Distributed Critical-Path Timing Monitor for a 65nm High-Performance Microprocessor","author":"drake","year":"2007","journal-title":"International Solid-State Circuits Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2008.4567288"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2005.863244"},{"key":"ref13","article-title":"High Speed Test Structures for In-Line Process Monitoring and Model Calibration","author":"ketchen","year":"2005","journal-title":"Intl Conf on Microelectronic Test Structures"},{"key":"ref14","article-title":"Product Representative ‘At-Speed’ Test Structures for CMOS Characterization","volume":"4 5","author":"ketchen","year":"2006","journal-title":"IBM Journal of Res & Dev"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437560"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1283780.1283821"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2007.374452"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558941"},{"key":"ref19","article-title":"Low-Cost On-Chip Structures for Measuring NBTI Effects, Variations, Path Delay, and Noise","author":"wang","year":"2010","journal-title":"SRC TECHCON Poster Presentation"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510876"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"ref6","article-title":"Testing the IBM POWER7TM 4 GHz Eight Core Microprocessor","author":"crafts","year":"2010","journal-title":"International Test Conference"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"ref8","article-title":"Architecting for Power Management: The IBM Power7 Approach","author":"ware","year":"2010","journal-title":"IEEE International Symposium on High-Performance Comp Architecture"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1147\/rd.516.0733"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470686"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297743"},{"key":"ref9","article-title":"Adaptive Energy Management Features of the POWER7™ Processor","volume":"22","author":"floyd","year":"2010","journal-title":"Hot Chips"},{"key":"ref20","article-title":"On-chip Negative Bias Temperature Instability Sensor using Slew Rate Monitoring Circuitry","author":"ghosh","year":"2009","journal-title":"IEEE Int Symp Low Power Electronics Design"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700550"}],"event":{"name":"2011 IEEE VLSI Test Symposium (VTS)","start":{"date-parts":[[2011,5,1]]},"location":"Dana Point, CA, USA","end":{"date-parts":[[2011,5,5]]}},"container-title":["29th VLSI Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5772241\/5783722\/05783743.pdf?arnumber=5783743","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T02:47:29Z","timestamp":1490064449000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783743\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/vts.2011.5783743","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}