{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,16]],"date-time":"2025-04-16T18:22:43Z","timestamp":1744827763398},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/vts.2011.5783780","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T16:35:25Z","timestamp":1307464525000},"page":"178-183","source":"Crossref","is-referenced-by-count":27,"title":["An industrial case study of analog fault modeling"],"prefix":"10.1109","author":[{"given":"Ender","family":"Yilmaz","sequence":"first","affiliation":[]},{"given":"Anne","family":"Meixner","sequence":"additional","affiliation":[]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232731"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.559332"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.285252"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.917578"},{"key":"ref14","first-page":"446","article-title":"A 16 Gb\/s Source-Series Terminated Transmitter in 65nm CMOS SOl","author":"menolfi","year":"0","journal-title":"ISSCC 2007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.42"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700557"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1991.164061"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1995.523755"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470319"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1173054"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.32"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1023\/A:1020892721493"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519719"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.21830"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639705"}],"event":{"name":"2011 IEEE VLSI Test Symposium (VTS)","start":{"date-parts":[[2011,5,1]]},"location":"Dana Point, CA, USA","end":{"date-parts":[[2011,5,5]]}},"container-title":["29th VLSI Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5772241\/5783722\/05783780.pdf?arnumber=5783780","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T07:28:13Z","timestamp":1490081293000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783780\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/vts.2011.5783780","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}