{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T06:27:34Z","timestamp":1749104854621,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/vts.2012.6231071","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T22:33:00Z","timestamp":1342737180000},"page":"1-6","source":"Crossref","is-referenced-by-count":28,"title":["Test generator with preselected toggling for low power built-in self-test"],"prefix":"10.1109","author":[{"given":"Janusz","family":"Rajski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Grzegorz","family":"Mrugalski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benoit","family":"Nadeau-Dostie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"crossref","first-page":"1565","DOI":"10.1109\/TCAD.2005.855927","article-title":"LT-RTPG: A new test-per-scan BIST TPG for low switching activity","volume":"25","author":"wang","year":"2006","journal-title":"IEEE Trans CAD"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041837"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.1013896"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ICECTECH.2011.5942075"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/IADCC.2009.4809027"},{"key":"13","first-page":"138","article-title":"Low-transition LFSR for BIST-based applications","author":"nourani","year":"2005","journal-title":"Proc ATS"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2002.1106816"},{"key":"11","first-page":"355","article-title":"Adaptive low shift power test pattern generator","author":"lin","year":"2010","journal-title":"Proc ATS"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700574"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297695"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843823"},{"key":"20","first-page":"133","article-title":"Power reduction in test-per-scan BIST","author":"zhang","year":"2000","journal-title":"Proc OLTW"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.842885"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1049\/el:20083481"},{"key":"10","first-page":"230","article-title":"A new low power test pattern generator using a transition monitoring window based on BIST architecture","author":"kim","year":"2005","journal-title":"Proc ATS"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033791"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923454"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766696"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805616"},{"key":"9","first-page":"49","article-title":"Low power serial built-in self-test","author":"hertwig","year":"1998","journal-title":"Proc ETS"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0928-2"}],"event":{"name":"2012 IEEE 30th VLSI Test Symposium (VTS)","start":{"date-parts":[[2012,4,23]]},"location":"Maui, HI, USA","end":{"date-parts":[[2012,4,25]]}},"container-title":["2012 IEEE 30th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6222548\/6231057\/06231071.pdf?arnumber=6231071","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T21:37:18Z","timestamp":1497994638000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6231071\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/vts.2012.6231071","relation":{},"subject":[],"published":{"date-parts":[[2012,4]]}}}