{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T00:59:34Z","timestamp":1729645174866,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vts.2013.6548882","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T14:59:10Z","timestamp":1373381950000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Finding best voltage and frequency to shorten power-constrained test time"],"prefix":"10.1109","author":[{"given":"P.","family":"Venkataramani","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Sindia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V. D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"crossref","first-page":"584","DOI":"10.1109\/4.52187","article-title":"Alpha power-law MOS model","volume":"25","author":"sakurai","year":"1990","journal-title":"IEEE Jour Solid State Circuits"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.200"},{"key":"17","first-page":"1","article-title":"Power-Aware Test: Challenges and solutions","author":"ravi","year":"2007","journal-title":"Proc International Test Conf"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2013.6562685"},{"key":"18","first-page":"4","article-title":"Alpha power-law MOS model","volume":"9","author":"sakurai","year":"2004","journal-title":"IEEE Solid-State Circuits Society Newsletter"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2001.934218"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1993.386427"},{"journal-title":"Power-Aware Testing and Test Strategies for Low-Power Devices","year":"2004","author":"girard","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173515"},{"key":"11","first-page":"110","article-title":"Hardware test pattern generation for built-in testing","author":"daehn","year":"1981","journal-title":"Proc International Test Conf"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437598"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2012.112"},{"journal-title":"Nanosim User Guide Synopsys","year":"2008","key":"3"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783729"},{"journal-title":"National Instruments","article-title":"Educational design and prototyping platform","year":"2012","key":"2"},{"journal-title":"National Instruments","article-title":"Lab view system design software","year":"2012","key":"1"},{"key":"10","first-page":"300","article-title":"On test time reduction using pattern overlapping, broadcasting and on-chip decompression","author":"chloupek","year":"2012","journal-title":"Proc IEEE 15th International Symp on Design and Diagnostics of Electronic Circuits Systems (DDECS)"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/4.792617"},{"journal-title":"DE2 Development and Education Board","year":"2012","key":"6"},{"journal-title":"Leonardo Spectrum User Guide Mentor Graphics Corp","year":"2011","key":"5"},{"journal-title":"ATPG and Failure Diagnosis Tools Mentor Graphics Corp","year":"2009","key":"4"},{"key":"9","article-title":"Essentials of electronic testing for digital","author":"bushnell","year":"2000","journal-title":"Memory and Mixed-Signal VLSI Circuits"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.881202"}],"event":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","start":{"date-parts":[[2013,4,29]]},"location":"Berkeley, CA","end":{"date-parts":[[2013,5,2]]}},"container-title":["2013 IEEE 31st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6530960\/6548868\/06548882.pdf?arnumber=6548882","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T15:58:07Z","timestamp":1498060687000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6548882\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/vts.2013.6548882","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}