{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T10:37:18Z","timestamp":1752230238461},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vts.2013.6548885","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T10:59:10Z","timestamp":1373367550000},"source":"Crossref","is-referenced-by-count":5,"title":["Selection of tests for outlier detection"],"prefix":"10.1109","author":[{"given":"H. C. M.","family":"Bossers","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. L.","family":"Hurink","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G. J. M.","family":"Smit","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699271"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011113"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437700"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.10"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139127"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240924"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763135"}],"event":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","location":"Berkeley, CA","start":{"date-parts":[[2013,4,29]]},"end":{"date-parts":[[2013,5,2]]}},"container-title":["2013 IEEE 31st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6530960\/6548868\/06548885.pdf?arnumber=6548885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:22:53Z","timestamp":1490217773000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6548885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/vts.2013.6548885","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}