{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T05:05:43Z","timestamp":1725512743788},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vts.2013.6548904","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T14:59:10Z","timestamp":1373381950000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["Contactless test access mechanism for TSV based 3D ICs"],"prefix":"10.1109","author":[{"given":"R.","family":"Rashidzadeh","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"17","first-page":"19","article-title":"Wafer-Level Characterization of Probecards using NAC Probing","author":"kim","year":"2008","journal-title":"Proc IEEE International Test Conference (ITC)"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457087"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783749"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.831448"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2007.4601902"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.886554"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2144596"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355573"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700612"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914762"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2160790"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231086"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699219"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469556"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139179"},{"key":"9","article-title":"The RF in RFID, passive UHF RFID in practice","author":"dobkin","year":"2008","journal-title":"Newnes Elsevier"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699296"}],"event":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","start":{"date-parts":[[2013,4,29]]},"location":"Berkeley, CA","end":{"date-parts":[[2013,5,2]]}},"container-title":["2013 IEEE 31st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6530960\/6548868\/06548904.pdf?arnumber=6548904","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T01:04:31Z","timestamp":1490231071000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6548904\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/vts.2013.6548904","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}