{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T05:03:31Z","timestamp":1725512611672},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vts.2013.6548928","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T10:59:10Z","timestamp":1373367550000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["An iterative diagnosis approach for ECC-based memory repair"],"prefix":"10.1109","author":[{"given":"P.","family":"Papavramidou","sequence":"first","affiliation":[]},{"given":"M.","family":"Nicolaidis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569372"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2211174"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.56"},{"year":"0","key":"16"},{"key":"13","article-title":"Test algorithms for eccbased memory repair in nanotechnologies","author":"papavramidou","year":"2012","journal-title":"IEEE VLSI Test Symposium"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843856"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2009.4977291"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299258"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2000.856639"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1989.56835"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041777"},{"key":"10","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-7958-2","article-title":"Nanoscale memory repair","author":"horiguchi","year":"2011","journal-title":"Springer Series Integrated Circuits and Systems"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2008.4734563"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743332"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.903940"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2005.007"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/6.833029"}],"event":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","start":{"date-parts":[[2013,4,29]]},"location":"Berkeley, CA","end":{"date-parts":[[2013,5,2]]}},"container-title":["2013 IEEE 31st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6530960\/6548868\/06548928.pdf?arnumber=6548928","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T11:58:10Z","timestamp":1498046290000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6548928\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2013.6548928","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}