{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:20:02Z","timestamp":1725560402830},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vts.2013.6548933","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T10:59:10Z","timestamp":1373367550000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["On-chip circuit for measuring multi-GHz clock signal waveforms"],"prefix":"10.1109","author":[{"given":"K. A.","family":"Jenkins","sequence":"first","affiliation":[]},{"given":"P.","family":"Restle","sequence":"additional","affiliation":[]},{"given":"P. Z.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"D.","family":"Hogenmiller","sequence":"additional","affiliation":[]},{"given":"D.","family":"Boerstler","sequence":"additional","affiliation":[]},{"given":"T.","family":"Bucelot","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"138","article-title":"Applications of on-chip samplers for test and measurement of integrated circuits","author":"ho","year":"1998","journal-title":"1998 Symposium on VLSI Circuits Digest of Technical Papers"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1049\/el:19931173"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.812313"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2000.852623"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557045"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2002.804491"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.2006.284466"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240902"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405703"}],"event":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","start":{"date-parts":[[2013,4,29]]},"location":"Berkeley, CA","end":{"date-parts":[[2013,5,2]]}},"container-title":["2013 IEEE 31st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6530960\/6548868\/06548933.pdf?arnumber=6548933","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:22:23Z","timestamp":1490217743000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6548933\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vts.2013.6548933","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}