{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T18:45:55Z","timestamp":1725734755583},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vts.2013.6548945","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T14:59:10Z","timestamp":1373381950000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Special session 12B: Panel post-silicon validation & test in huge variance era"],"prefix":"10.1109","author":[{"given":"Takahiro J.","family":"Yamaguchi","sequence":"first","affiliation":[{"name":"Advantest Laboratories Ltd.\/University of Tokyo"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[{"name":"Universityof Texas at Austin"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gordon W.","family":"Roberts","sequence":"additional","affiliation":[{"name":"McGill University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suriyaprakash","family":"Natarajan","sequence":"additional","affiliation":[{"name":"Intel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dennis","family":"Ciplickas","sequence":"additional","affiliation":[{"name":"PDF Solutions"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","start":{"date-parts":[[2013,4,29]]},"location":"Berkeley, CA, USA","end":{"date-parts":[[2013,5,2]]}},"container-title":["2013 IEEE 31st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6530960\/6548868\/06548945.pdf?arnumber=6548945","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T18:57:07Z","timestamp":1710356227000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6548945\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2013.6548945","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}