{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T11:41:22Z","timestamp":1725709282805},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/vts.2014.6818780","type":"proceedings-article","created":{"date-parts":[[2014,5,30]],"date-time":"2014-05-30T14:34:07Z","timestamp":1401460447000},"page":"1-2","source":"Crossref","is-referenced-by-count":4,"title":["Special session 8B — Panel: In-field testing of SoC devices: Which solutions by which players?"],"prefix":"10.1109","author":[{"given":"Jacob A.","family":"Abraham","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Teresa","family":"MacLaurin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul G.","family":"Ryan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitris","family":"Gizopoulos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1984.5005655"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675150"},{"key":"11","first-page":"990","article-title":"Native mode functional test generation for processors with applications to self test and design validation","author":"shen","year":"1998","journal-title":"IEEE International Test Conference"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.56"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.140"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847814"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818755"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676471"},{"key":"5","first-page":"43","article-title":"Increasing fault coverage during functional test in the operational phase","author":"de carvalho","year":"0","journal-title":"2013 IEEE 19th International On-Line Testing Symposium"},{"key":"4","first-page":"1462","article-title":"Online functionally untestable fault identification in embedded processor cores","author":"bernardi","year":"0","journal-title":"Design Automation & Test in Europe Conference & Exhibition (DATE) 2013"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699277"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297675"}],"event":{"name":"2014 IEEE 32nd VLSI Test Symposium (VTS)","start":{"date-parts":[[2014,4,13]]},"location":"Napa, CA, USA","end":{"date-parts":[[2014,4,17]]}},"container-title":["2014 IEEE 32nd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6811042\/6818727\/06818780.pdf?arnumber=6818780","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T13:55:27Z","timestamp":1490277327000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6818780\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/vts.2014.6818780","relation":{},"subject":[],"published":{"date-parts":[[2014,4]]}}}