{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:39:23Z","timestamp":1725518363960},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vts.2015.7116255","type":"proceedings-article","created":{"date-parts":[[2015,6,10]],"date-time":"2015-06-10T15:32:59Z","timestamp":1433950379000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["TMO: A new class of attack on cipher misusing test infrastructure"],"prefix":"10.1109","author":[{"given":"Sk Subidh","family":"Ali","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ozgur","family":"Sinanoglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2014.7004193"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2274619"},{"key":"ref10","first-page":"i","article-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","journal-title":"IEEE Std 1149 1–2001"},{"key":"ref6","first-page":"43","article-title":"A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures","author":"darolt","year":"0","journal-title":"DFT-2012"},{"article-title":"Fips pub 186–3 federal information processing standards publication digital signature standard (dss)","year":"2009","author":"gallagher","key":"ref11"},{"key":"ref5","first-page":"407","article-title":"Scan-based attack against elliptic curve cryptosystems","author":"nara","year":"0","journal-title":"ASP-DAC 2010"},{"year":"0","key":"ref8","article-title":"National Institute of Standards and Technology, Advanced Encryption Standard, NIST FIPS PUB 197, 2001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.36"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2005.193787"},{"journal-title":"Guide to Elliptic Curve Cryptography","year":"2003","author":"hankerson","key":"ref9"},{"key":"ref1","first-page":"339","article-title":"Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard","author":"yang","year":"0","journal-title":"ITCC 2004"}],"event":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","start":{"date-parts":[[2015,4,27]]},"location":"Napa, CA, USA","end":{"date-parts":[[2015,4,29]]}},"container-title":["2015 IEEE 33rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7104933\/7116233\/07116255.pdf?arnumber=7116255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:47:17Z","timestamp":1490370437000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7116255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vts.2015.7116255","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}