{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:43:22Z","timestamp":1749620602982,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vts.2015.7116260","type":"proceedings-article","created":{"date-parts":[[2015,6,10]],"date-time":"2015-06-10T19:32:59Z","timestamp":1433964779000},"page":"1-6","source":"Crossref","is-referenced-by-count":11,"title":["Statistical techniques for predicting system-level failure using stress-test data"],"prefix":"10.1109","author":[{"given":"Harry H.","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shih-Hua","family":"Kuo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jonathan","family":"Tung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mango C.-T.","family":"Chao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139153"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.37"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437626"},{"key":"ref13","first-page":"1","article-title":"Failing Frequency Signature Analysis","author":"lee","year":"2008","journal-title":"IEEE International Test Conference"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref15","first-page":"226","article-title":"A Density-Based Algorithm for Discovering Clusters in Large Spatial Databases with Noise","volume":"96","author":"ester","year":"1996","journal-title":"International conference on Knowledge discovery and data mining"},{"key":"ref16","article-title":"Iterative Knowledge Discovery for Screening Customer Returns","author":"sumikawa","year":"2013","journal-title":"IEEE International Workshop on Digital and Analog Test and Data Analysis (DATA)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387327"},{"key":"ref18","article-title":"Learning from Chips Behaving Badly","author":"chen","year":"2014","journal-title":"IEEE International Workshop on Defects Adaptive Test and Data Analysis (DATA)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090931"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437700"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651892"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139178"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556983"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783743"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583989"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178387"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139131"}],"event":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","start":{"date-parts":[[2015,4,27]]},"location":"Napa, CA, USA","end":{"date-parts":[[2015,4,29]]}},"container-title":["2015 IEEE 33rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7104933\/7116233\/07116260.pdf?arnumber=7116260","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:31:45Z","timestamp":1490383905000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7116260\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2015.7116260","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}