{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:38:17Z","timestamp":1725557897750},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vts.2015.7116264","type":"proceedings-article","created":{"date-parts":[[2015,6,10]],"date-time":"2015-06-10T19:32:59Z","timestamp":1433964779000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Panel: When will the cost of dependability end innovation in computer design?"],"prefix":"10.1109","author":[{"given":"Valeria","family":"Bertacco","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","start":{"date-parts":[[2015,4,27]]},"location":"Napa, CA, USA","end":{"date-parts":[[2015,4,29]]}},"container-title":["2015 IEEE 33rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7104933\/7116233\/07116264.pdf?arnumber=7116264","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:24:09Z","timestamp":1490383449000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7116264\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2015.7116264","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}