{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:54:21Z","timestamp":1725429261013},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vts.2015.7116298","type":"proceedings-article","created":{"date-parts":[[2015,6,10]],"date-time":"2015-06-10T19:32:59Z","timestamp":1433964779000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Test compaction by test cube merging for four-way bridging faults"],"prefix":"10.1109","author":[{"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.9188"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894271"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966690"},{"key":"ref13","article-title":"Defect-Based Tests: A Key Enabler for Successful Migration to Structural Test","author":"sengupta","year":"1999","journal-title":"Intel Technology Journal Q"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966689"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.110"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147186"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253737"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1995","author":"abramovici","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2126574"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/944027.944030"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/288548.288563"},{"key":"ref1","first-page":"237","author":"soenemann","year":"1991","journal-title":"L1–3K-uoaea test patterns tor Scan vesigns m rroc Europ Test Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2217360"}],"event":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","start":{"date-parts":[[2015,4,27]]},"location":"Napa, CA, USA","end":{"date-parts":[[2015,4,29]]}},"container-title":["2015 IEEE 33rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7104933\/7116233\/07116298.pdf?arnumber=7116298","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:31:43Z","timestamp":1490383903000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7116298\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/vts.2015.7116298","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}