{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T06:37:16Z","timestamp":1725777436687},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vts.2015.7116299","type":"proceedings-article","created":{"date-parts":[[2015,6,10]],"date-time":"2015-06-10T19:32:59Z","timestamp":1433964779000},"page":"1-1","source":"Crossref","is-referenced-by-count":2,"title":["Panel: Is design-for-security the new DFT?"],"prefix":"10.1109","author":[{"given":"Rob","family":"Aitken","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","start":{"date-parts":[[2015,4,27]]},"location":"Napa, CA, USA","end":{"date-parts":[[2015,4,29]]}},"container-title":["2015 IEEE 33rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7104933\/7116233\/07116299.pdf?arnumber=7116299","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:30:03Z","timestamp":1490383803000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7116299\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2015.7116299","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}