{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,11]],"date-time":"2024-08-11T05:52:03Z","timestamp":1723355523998},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/vts.2016.7477262","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T20:27:12Z","timestamp":1464294432000},"source":"Crossref","is-referenced-by-count":3,"title":["Infant mortality tests for analog and mixed-signal circuits"],"prefix":"10.1109","author":[{"given":"Suvadeep","family":"Banerjee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suriyaprakash","family":"Natarajan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Efficient simulation of parametric faults for multi-stage analog circuits","author":"liu","year":"2007","journal-title":"Test Conference 2007 ITC 2007 IEEE International"},{"key":"ref11","first-page":"226","article-title":"Test metrics for analog parametric faults","author":"sunter","year":"1999","journal-title":"VLSI Test Symposium 1999 Proceedings 17th IEEE"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840855"},{"key":"ref13","first-page":"249","article-title":"Parametric faults detection in analog circuits using polynomial coefficients in nn learning","author":"kuczynski","year":"2010","journal-title":"Signals and Electronic Systems (ICSES) 2010 International Conference on"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2201759"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2020721"},{"key":"ref16","first-page":"1","article-title":"Efficient simulation of parametric faults for multi-stage analog circuits","author":"liu","year":"2007","journal-title":"Test Conference 2007 ITC 2007 IEEE International"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2185931"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228544"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519719"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232731"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-007-5006-6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783780"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470319"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139127"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1991.164061"},{"key":"ref1","first-page":"236","article-title":"Simple and efficient algorithms for functional RAM testing","author":"marinescu","year":"1982","journal-title":"Proceedings International Test Conference 1982"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.818541"}],"event":{"name":"2016 IEEE 34th VLSI Test Symposium (VTS)","location":"Las Vegas, NV, USA","start":{"date-parts":[[2016,4,25]]},"end":{"date-parts":[[2016,4,27]]}},"container-title":["2016 IEEE 34th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7469602\/7477250\/07477262.pdf?arnumber=7477262","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T20:07:14Z","timestamp":1474661234000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7477262\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2016.7477262","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}