{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:11:12Z","timestamp":1725703872359},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/vts.2016.7477284","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T16:27:12Z","timestamp":1464280032000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Process independent gain measurement with low overhead via BIST\/DUT co-design"],"prefix":"10.1109","author":[{"given":"Jae Woong","family":"Jeong","sequence":"first","affiliation":[]},{"given":"Jennifer","family":"Kitchen","sequence":"additional","affiliation":[]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","article-title":"Design and verification of built-in-self-test (BIST) for RF, and Microwave applications","author":"elkassir","year":"2011","journal-title":"Microwave Integrated Circuits Conference (EuMIC) 2011 European"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651921"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2007.380895"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.917196"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537235"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.921299"},{"key":"ref15","first-page":"2","article-title":"Robust Built-In Test of RF ICs Using Envelope Detectors","author":"han","year":"2005","journal-title":"Test Symposium 2005 Proceedings 14th Asian"},{"key":"ref16","first-page":"149","article-title":"A highly-linear radio-frequency envelope detector for multi-standard operation","author":"cha","year":"2009","journal-title":"IEEE Radio Frequency Integrated Circuits Symposium"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138762"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342414"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.810063"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035319"},{"key":"ref4","first-page":"255","article-title":"Low-cost alternate EVM test for wireless receiver systems","author":"haider","year":"2005","journal-title":"Proc 23rd IEEE VLSI Test Symposium"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2440736"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.87"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017542"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2183370"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.34"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176656"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2008.4581614"},{"key":"ref9","first-page":"68","article-title":"A built-in loopback test methodlogy for RF transceiver circuits using embedded sensor circuits","author":"bhattacharya","year":"2004","journal-title":"Proc IEEE ATS"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.100"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2013.6626225"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342415"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2006.1651136"},{"key":"ref24","first-page":"218","article-title":"A 3.6 mW differentialcommon-gate CMOS LNA with positive-negative feedback","author":"woo","year":"2009","journal-title":"IEEE Int Solid-State Circuits Conf"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651885"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCAS.2009.5250368"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.920335"}],"event":{"name":"2016 IEEE 34th VLSI Test Symposium (VTS)","start":{"date-parts":[[2016,4,25]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2016,4,27]]}},"container-title":["2016 IEEE 34th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7469602\/7477250\/07477284.pdf?arnumber=7477284","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T16:07:21Z","timestamp":1474646841000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7477284\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/vts.2016.7477284","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}