{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T20:54:28Z","timestamp":1725396868293},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/vts.2016.7477296","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T20:27:12Z","timestamp":1464294432000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise"],"prefix":"10.1109","author":[{"given":"Yuming","family":"Zhuang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tao","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shravan","family":"Chaganti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Degang","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"207","author":"mcwhorter","year":"1957","journal-title":"Noise and Germanium Surface Properties in Semiconductor Surface Physics"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.329647"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/0375-9601(78)90249-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/16.47770"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3719\/13\/24\/007"},{"key":"ref15","first-page":"1935","article-title":"Phase Control of Triangular Stimulus Generator for ADC BIST","author":"jingbo","year":"2010","journal-title":"IEEE Int Symp Circuits Syst"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2010","key":"ref4"},{"journal-title":"Noise in Solid State Devices and Circuits","year":"1986","author":"van der ziel","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"journal-title":"IEEE Standard for Digitizing Waveform Recorders","year":"2007","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282187"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.904491"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2013","key":"ref1"},{"key":"ref9","first-page":"4835","article-title":"An N th-order central symmetrical layout pattern for nonlinear gradients cancellation","author":"dai","year":"2005","journal-title":"IEEE Int Symp Circuits Syst"}],"event":{"name":"2016 IEEE 34th VLSI Test Symposium (VTS)","start":{"date-parts":[[2016,4,25]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2016,4,27]]}},"container-title":["2016 IEEE 34th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7469602\/7477250\/07477296.pdf?arnumber=7477296","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T20:07:25Z","timestamp":1474661245000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7477296\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/vts.2016.7477296","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}