{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:15:43Z","timestamp":1781885743563,"version":"3.54.5"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/vts.2016.7477297","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T20:27:12Z","timestamp":1464294432000},"page":"1-6","source":"Crossref","is-referenced-by-count":11,"title":["On-die learning-based self-calibration of analog\/RF ICs"],"prefix":"10.1109","author":[{"given":"Georgios","family":"Volanis","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dzmitry","family":"Maliuk","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yichuan","family":"Lu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kiruba S.","family":"Subramani","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Angelos","family":"Antonopoulos","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2014.2354406"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2006863"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2011.5940633"},{"key":"ref13","first-page":"1","article-title":"An analog non-volatile neural network platform for prototyping RF BIST solutions","author":"maliuk","year":"2014","journal-title":"IEEE Design Automation and Test in Europe Conference and Exhibition"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICNN.1993.298623"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/4.568846"},{"key":"ref4","first-page":"61","article-title":"Yield recovery of RF transceiver systems using iterative tuning-driven power conscious performance optimization","volume":"32","author":"natarajan","year":"2015","journal-title":"IEEE Design & Test of Computers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.123"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699225"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"ref8","first-page":"21.3.1","article-title":"A comparative study of one-shot statistical calibration methods for analog\/RF ICs","author":"lu","year":"2015","journal-title":"IEEE International Test Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2014.6881337"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.58"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2333311"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"}],"event":{"name":"2016 IEEE 34th VLSI Test Symposium (VTS)","location":"Las Vegas, NV, USA","start":{"date-parts":[[2016,4,25]]},"end":{"date-parts":[[2016,4,27]]}},"container-title":["2016 IEEE 34th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7469602\/7477250\/07477297.pdf?arnumber=7477297","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T20:07:25Z","timestamp":1474661245000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7477297\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/vts.2016.7477297","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}