{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T17:15:51Z","timestamp":1725729351166},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/vts.2016.7477311","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T16:27:12Z","timestamp":1464280032000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Special panel session IIB: \"System validation and silicon debug \u2014 Is standardization possible?\""],"prefix":"10.1109","author":[{"given":"Mike","family":"Ricchetti","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eric","family":"Rentschler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amit","family":"Majumdar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mike","family":"Lowe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"LaVine","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Skip","family":"Lindsey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sharad","family":"Kumar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2016 IEEE 34th VLSI Test Symposium (VTS)","start":{"date-parts":[[2016,4,25]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2016,4,27]]}},"container-title":["2016 IEEE 34th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7469602\/7477250\/07477311.pdf?arnumber=7477311","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T16:07:29Z","timestamp":1474646849000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7477311\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2016.7477311","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}