{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,24]],"date-time":"2025-10-24T16:41:45Z","timestamp":1761324105572,"version":"3.41.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/vts.2017.7928946","type":"proceedings-article","created":{"date-parts":[[2017,5,18]],"date-time":"2017-05-18T22:35:20Z","timestamp":1495146920000},"page":"1-6","source":"Crossref","is-referenced-by-count":17,"title":["A novel design-for-security (DFS) architecture to prevent unauthorized IC overproduction"],"prefix":"10.1109","author":[{"given":"Ujjwal","family":"Guin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ziqi Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adit","family":"Singh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.24"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228377"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140252"},{"journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"ref13"},{"key":"ref14","first-page":"63","article-title":"Full Hold-Scan Systems in Microprocessors: Cost\/Benefit Analysis","volume":"8","author":"kuppuswamy","year":"2004","journal-title":"Intel Technical Journal"},{"key":"ref15","first-page":"1","article-title":"Functional fmax test-time reduction using novel dfts for circuit initialization","author":"guin","year":"2013","journal-title":"IEEE International Conference on Computer Design (ICCD)"},{"journal-title":"Synopsys","article-title":"Compression for Highest Test Quality and Lowest Test Cost","year":"2015","key":"ref16"},{"key":"ref17","article-title":"Choosing the Right Scan Compression Architecture for Your Design","author":"nagaraj","year":"2015","journal-title":"Tech Rep"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2893183"},{"key":"ref3","article-title":"Trends in the global IC design service market","author":"yeh","year":"2012","journal-title":"DigiTimes Research"},{"key":"ref6","first-page":"20:1","article-title":"Active hardware metering for intellectual property protection and security","author":"alkabani","year":"2007","journal-title":"SS'07 Proceedings of 16th USENIX Security Symposium on USENIX Security Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397343"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681649"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-319-11824-6","author":"tehranipoor","year":"2015","journal-title":"Counterfeit Integrated Circuits - Detection and Avoidance"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref9","first-page":"76","article-title":"IC activation and user authentication for security-sensitive systems","author":"huang","year":"2008","journal-title":"Proc IEEE Int Workshop Hardware-Oriented Security Trust"}],"event":{"name":"2017 IEEE 35th VLSI Test Symposium (VTS)","start":{"date-parts":[[2017,4,9]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2017,4,12]]}},"container-title":["2017 IEEE 35th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7921795\/7928905\/07928946.pdf?arnumber=7928946","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T18:04:53Z","timestamp":1750269893000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7928946\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/vts.2017.7928946","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}