{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:55:11Z","timestamp":1730303711362,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/vts.2017.7928950","type":"proceedings-article","created":{"date-parts":[[2017,5,18]],"date-time":"2017-05-18T18:35:20Z","timestamp":1495132520000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter"],"prefix":"10.1109","author":[{"given":"Shravan","family":"Chaganti","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Degang","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TEST.1994.528023"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/19.930455"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TEST.2015.7342384"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TEST.2008.4700639"},{"key":"ref14","first-page":"1039","article-title":"Sub-picosecond aperture-uncertainty measurements [ADCs]","volume":"51","author":"chiorboli","year":"2002","journal-title":"Transact IEEE"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIM.2009.2013674"},{"year":"2010","journal-title":"Standard for Terminology and Test Methods for Analogto- Digital Converters","key":"ref3"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ISCAS.1995.521615"},{"key":"ref5","first-page":"1","article-title":"Fast & accurate algorithm for jitter test with a single frequency test signal","author":"minshun","year":"2011","journal-title":"2011 IEEE International Conference on Electro\/Information Technology (EIT)"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ISCAS.2015.7169137"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/VTS.2015.7116248"},{"key":"ref2","article-title":"The Data Conversion Handbook","author":"kester","year":"2004","journal-title":"Analog Devices Inc"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TCSI.2011.2106030"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/VTS.2014.6818743"}],"event":{"name":"2017 IEEE 35th VLSI Test Symposium (VTS)","start":{"date-parts":[[2017,4,9]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2017,4,12]]}},"container-title":["2017 IEEE 35th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7921795\/7928905\/07928950.pdf?arnumber=7928950","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,31]],"date-time":"2017-05-31T00:20:24Z","timestamp":1496190024000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7928950\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/vts.2017.7928950","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}