{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:41:38Z","timestamp":1725507698188},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/vts.2017.7928952","type":"proceedings-article","created":{"date-parts":[[2017,5,18]],"date-time":"2017-05-18T22:35:20Z","timestamp":1495146920000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Knob non-idealities in learning-based post-production tuning of analog\/RF ICs: Impact & remedies"],"prefix":"10.1109","author":[{"given":"Yichuan","family":"Lu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georgios","family":"Volanis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kiruba S.","family":"Subramani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Angelos","family":"Antonopoulos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2361716"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2015.09.014"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342415"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2333311"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"ref15","first-page":"106","article-title":"On-chip self-calibration of RF circuits using specification-driven built-in self test (S-BIST)","author":"han","year":"2005","journal-title":"IEEE Int On-Line Testing Symposium (IOLTS)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2015.7177860"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.842831"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2013.6569520"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7539168"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2220332"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2010.5477307"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2009.2017249"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.123"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.853893"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477297"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2598184"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2243750"}],"event":{"name":"2017 IEEE 35th VLSI Test Symposium (VTS)","start":{"date-parts":[[2017,4,9]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2017,4,12]]}},"container-title":["2017 IEEE 35th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7921795\/7928905\/07928952.pdf?arnumber=7928952","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,31]],"date-time":"2017-05-31T04:18:27Z","timestamp":1496204307000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7928952\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2017.7928952","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}