{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:55:18Z","timestamp":1730303718044,"version":"3.28.0"},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/vts.2018.8368628","type":"proceedings-article","created":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:16:52Z","timestamp":1527805012000},"page":"1-1","source":"Crossref","is-referenced-by-count":1,"title":["Special session: How approximate computing impacts verification, test and reliability"],"prefix":"10.1109","author":[{"given":"L.","family":"Sekanina","sequence":"first","affiliation":[]},{"given":"Z.","family":"Vasicek","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"M.","family":"Traiola","sequence":"additional","affiliation":[]},{"given":"P.","family":"Rech","sequence":"additional","affiliation":[]},{"given":"D.","family":"Oliveria","sequence":"additional","affiliation":[]},{"given":"F.","family":"Fernandes","sequence":"additional","affiliation":[]},{"given":"S.","family":"Di Carlo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3126908.3126960"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2017.7934574"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203807"},{"key":"ref1","first-page":"62:1","volume":"48","author":"mittal","year":"2016","journal-title":"A survey of techniques for approximate computing &#x201D; ACM Comput Surv"}],"event":{"name":"2018 IEEE 36th VLSI Test Symposium (VTS)","start":{"date-parts":[[2018,4,22]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2018,4,25]]}},"container-title":["2018 IEEE 36th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8362837\/8368610\/08368628.pdf?arnumber=8368628","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,13]],"date-time":"2018-06-13T16:48:02Z","timestamp":1528908482000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8368628\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/vts.2018.8368628","relation":{},"subject":[],"published":{"date-parts":[[2018,4]]}}}