{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T19:05:16Z","timestamp":1725390316652},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/vts.2018.8368629","type":"proceedings-article","created":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:16:52Z","timestamp":1527805012000},"page":"1-1","source":"Crossref","is-referenced-by-count":1,"title":["Innovative practices on quality levels of A\/MS devices"],"prefix":"10.1109","author":[{"given":"Wim","family":"Dobbelaere","sequence":"first","affiliation":[]},{"given":"On","family":"Semi","sequence":"additional","affiliation":[]},{"given":"Massimo","family":"Violante","sequence":"additional","affiliation":[]},{"given":"Turin","family":"Polytechnic","sequence":"additional","affiliation":[]},{"given":"Jeff","family":"Rearick","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2018 IEEE 36th VLSI Test Symposium (VTS)","start":{"date-parts":[[2018,4,22]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2018,4,25]]}},"container-title":["2018 IEEE 36th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8362837\/8368610\/08368629.pdf?arnumber=8368629","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:17:02Z","timestamp":1527805022000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8368629\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2018.8368629","relation":{},"subject":[],"published":{"date-parts":[[2018,4]]}}}