{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:03:51Z","timestamp":1751094231213},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/vts.2018.8368639","type":"proceedings-article","created":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:16:52Z","timestamp":1527805012000},"page":"1-1","source":"Crossref","is-referenced-by-count":1,"title":["Innovative practices on functional testing and fault simulation for FuSa"],"prefix":"10.1109","author":[{"given":"Anandh","family":"Krishnan","sequence":"first","affiliation":[]},{"given":"John","family":"van Gelder","sequence":"additional","affiliation":[]},{"given":"Mayukh","family":"Bhattacharya","sequence":"additional","affiliation":[]},{"given":"Sreejit","family":"Chakravarty","sequence":"additional","affiliation":[]},{"given":"Prashant","family":"Goteti","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2018 IEEE 36th VLSI Test Symposium (VTS)","start":{"date-parts":[[2018,4,22]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2018,4,25]]}},"container-title":["2018 IEEE 36th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8362837\/8368610\/08368639.pdf?arnumber=8368639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:16:58Z","timestamp":1527805018000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8368639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vts.2018.8368639","relation":{},"subject":[],"published":{"date-parts":[[2018,4]]}}}