{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T16:32:17Z","timestamp":1725726737263},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/vts.2018.8368640","type":"proceedings-article","created":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:16:52Z","timestamp":1527805012000},"page":"1-6","source":"Crossref","is-referenced-by-count":13,"title":["Broadcast-based minimization of the overall access time for the IEEE 1687 network"],"prefix":"10.1109","author":[{"given":"Zhanwei","family":"Zhong","sequence":"first","affiliation":[]},{"given":"Guoliang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Qinfu","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Jun","family":"Qian","sequence":"additional","affiliation":[]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/DATE.2011.5763228"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/IOLTS.2016.7604692"},{"year":"1998","author":"schrijver","journal-title":"Theory of Linear and Integer Programming","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ATS.2010.83"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/VTS.2016.7477309"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TEST.2015.7342408"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TEST.2012.6401555"},{"year":"2001","journal-title":"IEEE standard test access port and boundary scan architecture","key":"ref2"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/ATS.2011.80"},{"year":"2014","journal-title":"IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device","key":"ref1"}],"event":{"name":"2018 IEEE 36th VLSI Test Symposium (VTS)","start":{"date-parts":[[2018,4,22]]},"location":"San Francisco, CA","end":{"date-parts":[[2018,4,25]]}},"container-title":["2018 IEEE 36th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8362837\/8368610\/08368640.pdf?arnumber=8368640","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,18]],"date-time":"2018-06-18T23:25:41Z","timestamp":1529364341000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8368640\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/vts.2018.8368640","relation":{},"subject":[],"published":{"date-parts":[[2018,4]]}}}