{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:39:08Z","timestamp":1762252748722,"version":"3.28.0"},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/vts.2018.8368664","type":"proceedings-article","created":{"date-parts":[[2018,5,31]],"date-time":"2018-05-31T22:16:52Z","timestamp":1527805012000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["NOIDA: Noise-resistant Intra-cell Diagnosis"],"prefix":"10.1109","author":[{"given":"Soumya","family":"Mittal","sequence":"first","affiliation":[]},{"given":"R. D. Shawn","family":"Blanton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/DAC.1983.1585651"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1007\/s10836-014-5481-5"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/TCAD.2009.2017216"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/DATE.2009.5090808"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/ATS.2017.48"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TEST.2000.894213"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/VTS.2002.1011137"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TEST.2006.297715"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"248","DOI":"10.1109\/ATS.2005.32","article-title":"Bridge Defect Diagnosis with Physical Information","author":"zou","year":"2005","journal-title":"IEEE Asian Test Symposium"},{"key":"ref14","first-page":"248","article-title":"Diagnosis of Byzantine Open-segment Faults [Scan Testing]","author":"huang","year":"2002","journal-title":"IEEE Asian Test Symposium"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TEST.2008.4700589"},{"key":"ref16","first-page":"12","article-title":"Experiences with Layout-aware Diagnosis - A Case Study","volume":"12","author":"chang","year":"2010","journal-title":"Electronic Device Failure Analysis"},{"key":"ref17","first-page":"412","article-title":"Yield Learning with Layout-aware Advanced Scan Diagnosis","volume":"32","author":"mekkoth","year":"2006","journal-title":"International Symposium for Testing and Failure Analysis"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TEST.2006.297627"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TCAD.2014.2323216"},{"year":"2008","journal-title":"Nangate 45nm open cell library","key":"ref28"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TCAD.2011.2113670"},{"key":"ref27","doi-asserted-by":"crossref","first-page":"490","DOI":"10.1109\/DATE.2003.1253657","article-title":"On Modeling Cross-Talk Faults","author":"zachariah","year":"2003","journal-title":"Design Automation and Test in Europe Conference and Exhibition"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TEST.2010.5699270"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ICCAD.1993.580105"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1049\/iet-cdt:20060206"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ICCAD.1992.279361"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1109\/ETS.2007.9","article-title":"Adaptive Debug and Diagnosis without Fault Dictionaries","author":"holst","year":"2007","journal-title":"IEEE European Test Symposium"},{"key":"ref7","first-page":"576","article-title":"Fault Dictionary Compaction by Output Sequence Removal","author":"boppana","year":"1994","journal-title":"International Conference on Computer-Aided Design"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MDT.2011.2178587"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TEST.2001.966644"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ETS.2007.11"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/ETS.2016.7519313"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TEST.2006.297661"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/ATS.2014.58"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/TEST.1988.207759"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TEST.2000.894222"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/VLSI-DAT.2015.7114547"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TEST.2012.6401565"}],"event":{"name":"2018 IEEE 36th VLSI Test Symposium (VTS)","start":{"date-parts":[[2018,4,22]]},"location":"San Francisco, CA","end":{"date-parts":[[2018,4,25]]}},"container-title":["2018 IEEE 36th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8362837\/8368610\/08368664.pdf?arnumber=8368664","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,24]],"date-time":"2022-08-24T21:09:46Z","timestamp":1661375386000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8368664\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/vts.2018.8368664","relation":{},"subject":[],"published":{"date-parts":[[2018,4]]}}}