{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T08:31:20Z","timestamp":1762504280020,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/vts.2019.8758601","type":"proceedings-article","created":{"date-parts":[[2019,7,11]],"date-time":"2019-07-11T23:56:14Z","timestamp":1562889374000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test"],"prefix":"10.1109","author":[{"given":"Cheng","family":"Ban","sequence":"first","affiliation":[]},{"given":"Minshun","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Jiangtao","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Li","family":"Geng","sequence":"additional","affiliation":[]},{"given":"Degang","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2180971"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2267473"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2709467"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477282"},{"key":"ref14","first-page":"1398","article-title":"A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling","author":"yu","year":"2004","journal-title":"Proceedings IEEE Int Test Conference"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2010.5712927"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2011.5944273"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139176"},{"key":"ref18","first-page":"1","article-title":"Accurate Spectral Testing with Non-coherent Sampling for Multi-Tone Test","author":"zhuang","year":"2018","journal-title":"IEEE Transactions on Circuits and Systems II Express Briefs"},{"journal-title":"IEEE Standard for Digitizing Waveform Recorders","year":"2008","key":"ref4"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog to Digital Converters","year":"2011","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.10837"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-77718-4"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"880","DOI":"10.1109\/TIM.2013.2243500","article-title":"Acceleration of the ADC Test With Sine-Wave Fit","volume":"62","author":"vilmos","year":"2013","journal-title":"IEEE Trans Instr & Meas"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2401211"},{"journal-title":"An Introduction to Mixed-Signal IC Test and Measurement","year":"2012","author":"burns","key":"ref2"},{"key":"ref9","first-page":"1189","article-title":"Properties of the IEEE-STD-1057 Four-Parameter Sine Wave Fit Algorithm","volume":"49","author":"peter","year":"2013","journal-title":"IEEE Trans Instr & Meas"},{"key":"ref1","article-title":"RF Microelectronics","author":"razavi","year":"1998","journal-title":"Prentice Hall Communications Engineering And emerging Technologies Series"}],"event":{"name":"2019 IEEE 37th VLSI Test Symposium (VTS)","start":{"date-parts":[[2019,4,23]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,25]]}},"container-title":["2019 IEEE 37th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8753115\/8758605\/08758601.pdf?arnumber=8758601","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T14:52:56Z","timestamp":1658155976000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8758601\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vts.2019.8758601","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}